master 发表于 2020-4-12 13:21:24

Fundamental Of Testing On ATE /半导体测试原理


1. Introduction to Semiconductor Testing    Design and manufacturing cycle of anIC    Semiconductor Companies/Staffs    ATE – Automated Test Equipment and itscomponents     Load boards, Probe cards, Handlers, Probers   2.Project Plan, Specifications and Test Program    Project/Test Plan – Introduction,Benefits, Requirement, Sample    Specifications – Design, Test, Device,Sample    Test Program – Types, Consideration, TestFlow, Binning, Summary    Common Categories of Test for SemiconductorDevice    Functional, DC, AC Specifications of Device3. DC Parameters Test (includingContinuity Test)     Continuity Test - Concept, Test Method,Sample Datalog     DC Tests – Concept and Test Method          Power Supply Current Test (IDD)          Leakage Test (IIL/IIH)          IOZL/IOZH, IOS          VOL/IOL, VOH/IOH      ATE DC Subsystem - VI Source, DC Meter,DC Matrix, Relay Control4. DigitalFunctional Test     ATE Pin Electronics     Test Concepts – Pattern, Timing, Levels     IO Signals – Input Signal Generation,Output Signal Compare     Functional Testing Basic – ExampleVIL/VIH, VOL/VOH     Test Vectors5. AC Parameters Test      AC Timing Tests - Setup Time, Hold Time,Propagation Delay, etc     ATE Time Measurement Subsystem     Timing Calibration6. Introduction toMixed Signal Testing     Sampling Theory – Nyquist Theorem,Coherency Formula     Fast Fourier Transform (FFT) – FrequencyDomain Analysis      Generic Mixed Signal Tester Architecture –AWG and Digitizer7. ADC and DAC Test     ADC and DAC Basic     Static Test – Histogram method  (INL, DNL)     Dynamic Test – SNR, THD, SINAD8. Debug Tools andDebugging     Tools - Datalog, Histogram, Shmoo, PatternDebugger, Waveform Tool     Trouble-Shooting Techniques       9. Introduction toDesign-For-Testability     DFT consideration     Test Approach – AdHoc, Scan (andBoundary Scan), Self-Test (BIST)

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